목록 관리 검색 Characterizing local structure of SiOx using confocal μ-Raman spectroscopy and its effects on electrochemical property Author Sunyoung Yoo, Jeonghan Kim and Byoungwoo Kang Journal Electrochimica Acta Vol 212 Page 68-75 Year 2016 Link https://www.sciencedirect.com/science/article/pii/S0013468616314839?vi… 381회 연결 Sunyoung Yoo, Jeonghan Kim and Byoungwoo Kang, "Characterizing local structure of SiOx using confocal μ-Raman spectroscopy and its effects on electrochemical property ", Electrochimica Acta., 212, 68-75 (2016) 상단으로